{"ezoma_uuid":"83fe6b5c-6cb4-52e4-9439-2cfa05ce133a","name":"Nx Rev Inc","address1":"3375 Scott Blvd","address2":"","city":"Santa Clara","state":"CA","zip":"95054","phone":"(408) 986-0200","extra_phone":"(408) 582-0377","categories":[{"code":"8011280","name":"Computer Service & Repair-Business"},{"code":"8004602","name":"Computer Software & Services"}],"primary_category":"Computer Service & Repair-Business","business_closed":"","website_address":"http://www.nxrev.com","email":"Info@zyetric.com","hours":{},"holiday_hours":{},"payments_accepted":"","latitude":"37.38072","longitude":"-121.98462","reviews_requested_at":null,"overall_score":null,"subscription_tier":"free","last_verified_at":null,"auxiliary_r2_key":null,"selected_categories":null,"media":null,"blogs":null,"review_count":1,"average_rating":5,"website_scraped_at":null,"door_pin":null,"prompts":null,"reviews":[{"author_name":"parola","review_text":"Independent Laboratory specializing in Analysis ofSemiconductor and Electronic Devices  since 1982Failure Analysis & Characterization of:* Semiconductor Devices * Passive Electronic Components* Printed Circuit Boards (PCB)* Micro Electro Mechanical Systems (MEMS)* Fiber Optic Components* Optoelectronic Devices* Solar Cells* Hybrid assemblies* Flat Panel Displays* Bioelectronic Materials & Components* Image SensorsServices:* SPICE Modeling Service* SPICE Models Extractions and Validations* Statistical SPICE Models Extractions and Validations* Existing SPICE Models Quality Check and Correction * Process Design Kits SPICE Models Quality Check and Correction * Circuit SPICE simulations* Scanning Capacitance Microscopy (SCM)* Metallurgical Failure Analysis* Package Decapsulation* Cross-Sectioning* Parallel and Angle Lapping* Sequential Stripback* Destructive Physical Analysis (DPA)* Optical Microscopy* X-ray Radiography* Scanning Electron Microscopy (SEM)* Emission Microscopy* X-ray Energy Dispersive Spectroscopy (XED)* Auger Electron Spectroscopy (AES)* Secondary Ion Mass Spectroscopy (SIMS)* Atomic Force Microscopy (AFM)* Focused Ion Beam (FIB)* Electrical Failure Analysis* Electrical characterization* Voltage Contrast* Optical Beam Induced Current (OBIC)* Electron Beam Induced Current (EBIC)* Electrostatic Discharge Sensitivity Test (ESD)* Latchup Evaluation* Focused Ion Beam (FIB) Circuit Modification* FIB Electrical Troubleshooting* Dielectric Integrity Tests* Hot Spot Detection* Intellectual Property (IP) technical consulting* Patent litigation technical consulting* MIL-STD Certifications","rating":5,"date_published":"2008-18-10"}]}